Publication:
Microprocessor error diagnosis by trace monitoring under laser testing

Thumbnail Image
Identifiers
URI: https://hdl.handle.net/10016/35163
ISSN: 0018-9499
ISSN: 1558-1578 (online)
DOI: 10.1109/TNS.2021.3067554
UXXI: AR/0000028793
Files
microprocessor_TNS_2021_ps.pdf (827.43 KB)
Publication date
2021-08
Defense date
Authors
Advisors
Tutors
Journal Title
Journal ISSN
Volume Title
Publisher
IEEE
Impact
Google Scholar
Export
Research Projects
Organizational Units
Journal Issue
Abstract
This work explores the diagnosis capabilities of the enriched information provided by microprocessors trace subsystem combined with laser fault injection. Laser fault injection campaigns with delimited architectural regions have been accomplished on an ARM Cortex-A9 device. Experimental results demonstrate the capability of the presented technique to provide additional information of the various error mechanisms that can happen in a microprocessor. A comparison with radiation campaigns presented in previous work is also discussed, showing that laser fault injection results are in good agreement with neutron and proton radiation results.
Description
Keywords
ARM, Error diagnosis, Fault tolerance, Laser fault injection, Microprocessor trace
Bibliographic citation
Peña-Fernández, M., et al. Microprocessor error diagnosis by trace monitoring under laser testing. In:IEEE transactions on nuclear science, 68(8), Aug. 2021, Pp. 1651-1659
Collections
DTE - DMA - Artículos de Revistas