RT Journal Article
T1 Microprocessor error diagnosis by trace monitoring under laser testing
A1 Peña Fernández, Manuel
A1 Lindoso Muñoz, Almudena
A1 Entrena Arrontes, Luis Alfonso
A1 Lopes, Israel C.
A1 Pouget, Vincent
AB This work explores the diagnosis capabilities of the enriched information provided by microprocessors trace subsystem combined with laser fault injection. Laser fault injection campaigns with delimited architectural regions have been accomplished on an ARM Cortex-A9 device. Experimental results demonstrate the capability of the presented technique to provide additional information of the various error mechanisms that can happen in a microprocessor. A comparison with radiation campaigns presented in previous work is also discussed, showing that laser fault injection results are in good agreement with neutron and proton radiation results.
PB IEEE
SN 0018-9499
SN 1558-1578 (online)
YR 2021
FD 2021-08
LK http://hdl.handle.net/10016/35163
UL http://hdl.handle.net/10016/35163
LA eng
DS e-Archivo
RD 30 abr. 2024