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Microprocessor error diagnosis by trace monitoring under laser testing

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dc.affiliation.dptoUC3M. Departamento de Tecnología Electrónicaes
dc.affiliation.grupoinvUC3M. Grupo de Investigación: Diseño Microelectrónico y Aplicaciones (DMA)es
dc.contributor.authorPeña Fernández, Manuel
dc.contributor.authorLindoso Muñoz, Almudena
dc.contributor.authorEntrena Arrontes, Luis Alfonso
dc.contributor.authorLopes, Israel C.
dc.contributor.authorPouget, Vincent
dc.contributor.funderComunidad de Madrides
dc.date.accessioned2022-06-17T11:35:17Z
dc.date.available2022-06-17T11:35:17Z
dc.date.issued2021-08
dc.description.abstractThis work explores the diagnosis capabilities of the enriched information provided by microprocessors trace subsystem combined with laser fault injection. Laser fault injection campaigns with delimited architectural regions have been accomplished on an ARM Cortex-A9 device. Experimental results demonstrate the capability of the presented technique to provide additional information of the various error mechanisms that can happen in a microprocessor. A comparison with radiation campaigns presented in previous work is also discussed, showing that laser fault injection results are in good agreement with neutron and proton radiation results.es
dc.format.extent9es
dc.identifier.bibliographicCitationPeña-Fernández, M., et al. Microprocessor error diagnosis by trace monitoring under laser testing. In:IEEE transactions on nuclear science, 68(8), Aug. 2021, Pp. 1651-1659es
dc.identifier.doi10.1109/TNS.2021.3067554
dc.identifier.issn0018-9499
dc.identifier.issn1558-1578 (online)
dc.identifier.publicationfirstpage1651es
dc.identifier.publicationissue8es
dc.identifier.publicationlastpage1659es
dc.identifier.publicationtitleIEEE TRANSACTIONS ON NUCLEAR SCIENCEen
dc.identifier.publicationvolume68es
dc.identifier.urihttps://hdl.handle.net/10016/35163
dc.identifier.uxxiAR/0000028793
dc.language.isoengen
dc.publisherIEEEen
dc.relation.projectIDComunidad de Madrid. IND2017/TIC-7776es
dc.relation.projectIDGobierno de España. PID2019-106455GB-C21es
dc.rights© 2021 IEEE.en
dc.rights.accessRightsopen accessen
dc.subject.ecienciaElectrónicaes
dc.subject.ecienciaIngeniería Mecánicaes
dc.subject.otherARMen
dc.subject.otherError diagnosisen
dc.subject.otherFault toleranceen
dc.subject.otherLaser fault injectionen
dc.subject.otherMicroprocessor traceen
dc.titleMicroprocessor error diagnosis by trace monitoring under laser testingen
dc.typeresearch article*
dc.type.hasVersionAM*
dspace.entity.typePublication
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