Publication: Error Detection and Mitigation of Data-Intensive Microprocessor Applications Using SIMD and Trace Monitoring
Loading...
Identifiers
Publication date
2020-07
Defense date
Advisors
Tutors
Journal Title
Journal ISSN
Volume Title
Publisher
IEEE
Impact
Export
Abstract
This article proposes a software error mitigation approach that uses the single instruction multiple data (SIMD) coprocessor to accelerate computation over redundant data. In addition, an external IP connected to the microprocessor's trace interface is used to detect errors that are difficult to cover with software-implemented techniques. The proposed approach has been implemented in an ARM microprocessor, and an irradiation campaign with neutrons has been carried out at Los Alamos National Laboratory. Experimental results demonstrate the high error coverage (more than 99.9%) of the proposed approach. The neutron cross section of errors that were not corrected nor detected was reduced by more than three orders of magnitude.
Description
Keywords
ARM, Error detection, Error mitigation, Microprocessor, Microprocessor trace, Neon, Single instruction multiple data (SIMD)
Bibliographic citation
Pena-Fernandez, M., Lindoso, A., Entrena, L. & Garcia-Valderas, M. (2020). Error Detection and Mitigation of Data-Intensive Microprocessor Applications Using SIMD and Trace Monitoring. IEEE Transactions on Nuclear Science, 67(7), pp. 1452–1460.