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Error Detection and Mitigation of Data-Intensive Microprocessor Applications Using SIMD and Trace Monitoring

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dc.affiliation.dptoUC3M. Departamento de Tecnología Electrónicaes
dc.affiliation.grupoinvUC3M. Grupo de Investigación: Diseño Microelectrónico y Aplicaciones (DMA)es
dc.contributor.authorPeña Fernandez, Manuel
dc.contributor.authorLindoso Muñoz, Almudena
dc.contributor.authorEntrena Arrontes, Luis Alfonso
dc.contributor.authorGarcía Valderas, Mario
dc.contributor.funderMinisterio de Economía y Competitividad (España)es
dc.contributor.funderComunidad de Madrides
dc.date.accessioned2021-05-20T10:15:33Z
dc.date.available2021-05-20T10:15:33Z
dc.date.issued2020-07
dc.description.abstractThis article proposes a software error mitigation approach that uses the single instruction multiple data (SIMD) coprocessor to accelerate computation over redundant data. In addition, an external IP connected to the microprocessor's trace interface is used to detect errors that are difficult to cover with software-implemented techniques. The proposed approach has been implemented in an ARM microprocessor, and an irradiation campaign with neutrons has been carried out at Los Alamos National Laboratory. Experimental results demonstrate the high error coverage (more than 99.9%) of the proposed approach. The neutron cross section of errors that were not corrected nor detected was reduced by more than three orders of magnitude.en
dc.format.extent9
dc.identifier.bibliographicCitationPena-Fernandez, M., Lindoso, A., Entrena, L. & Garcia-Valderas, M. (2020). Error Detection and Mitigation of Data-Intensive Microprocessor Applications Using SIMD and Trace Monitoring. IEEE Transactions on Nuclear Science, 67(7), pp. 1452–1460.en
dc.identifier.doihttps://doi.org/10.1109/TNS.2020.2992299
dc.identifier.issn0018-9499
dc.identifier.publicationfirstpage1452
dc.identifier.publicationissue7
dc.identifier.publicationlastpage1460
dc.identifier.publicationtitleIEEE Transactions on Nuclear Scienceen
dc.identifier.publicationvolume67
dc.identifier.urihttps://hdl.handle.net/10016/32701
dc.identifier.uxxiAR/0000026785
dc.language.isoeng
dc.publisherIEEE
dc.relation.projectIDGobierno de España. ESP2015-68245-C4-1-Pes
dc.relation.projectIDComunidad de Madrid. IND2017/TIC-7776es
dc.rights© 2020, IEEE
dc.rights.accessRightsopen access
dc.subject.ecienciaElectrónicaes
dc.subject.otherARMen
dc.subject.otherError detectionen
dc.subject.otherError mitigationen
dc.subject.otherMicroprocessoren
dc.subject.otherMicroprocessor traceen
dc.subject.otherNeonen
dc.subject.otherSingle instruction multiple data (SIMD)en
dc.titleError Detection and Mitigation of Data-Intensive Microprocessor Applications Using SIMD and Trace Monitoringen
dc.typeresearch article*
dc.type.hasVersionAM*
dspace.entity.typePublication
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