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Evaluating reliability through soft error triggered exceptions at ARM Cortex-A9 microprocessor

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dc.affiliation.dptoUC3M. Departamento de Tecnología Electrónicaes
dc.affiliation.grupoinvUC3M. Grupo de Investigación: Diseño Microelectrónico y Aplicaciones (DMA)es
dc.contributor.authorAvilés, Pablo M.
dc.contributor.authorLindoso Muñoz, Almudena
dc.contributor.authorBelloch Rodríguez, José Antonio
dc.contributor.authorEntrena Arrontes, Luis Alfonso
dc.contributor.funderComunidad de Madrides
dc.contributor.funderMinisterio de Ciencia e Innovación (España)es
dc.date.accessioned2022-08-30T10:50:41Z
dc.date.available2023-11-01T00:00:06Z
dc.date.issued2021-11
dc.descriptionProceeding of: 32th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2021), Bourdeaux, France, October 4th to 8th, 2021 (Virtual conference)en
dc.description.abstractARM Cortex-A9 is a high-end microprocessor present in multiple programmable System-on-Chip that is used in many application fields, including those with high reliability requirements. This work aims to understand better the behaviour of a high-end microprocessor in a harsh environment through the analysis, evaluation, and classification of exceptions. Exceptions triggered by radiation effects may end up in an unresponsive state of the microprocessor which is undesirable in high reliability scenarios. Experimental results of both fault injection and irradiation presented in this work provide an extensive analysis of the exceptions and their relationship with the executed code, the usage of operating systems and microprocessor architecture.en
dc.description.sponsorshipThis work has been supported in part by the Spanish Ministry of Science and Innovation under project ID2019-106455GB-C21 and by the Community of Madrid under project no. 49.520608.9.18.en
dc.format.extent6es
dc.identifier.bibliographicCitationAvilés, Pablo M., et al. Evaluating reliability through soft error triggered exceptions at ARM Cortex-A9 microprocessor. Microelectronics reliability, Vol. 126, 114323 (Special issue: Proceedings of ESREF 2021, 32th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis). Elsevier Ltd, Nov. 2021, 6 p.en
dc.identifier.doihttps://doi.org/10.1016/j.microrel.2021.114323
dc.identifier.issn0026-2714
dc.identifier.publicationfirstpage1es
dc.identifier.publicationissue114323es
dc.identifier.publicationlastpage6es
dc.identifier.publicationtitleMicroelectronics reliability, Special issue: Proceedings of ESREF 2021, 32th European Symposium on Reliability of Electron Devices, Failure Physics and Analysisen
dc.identifier.publicationvolume114
dc.identifier.urihttps://hdl.handle.net/10016/35611
dc.identifier.uxxiCC/0000033197
dc.language.isoengen
dc.publisherElsevier Ltd.en
dc.relation.eventdate2021-10-04es
dc.relation.eventplaceBurdeos, FRANCIAes
dc.relation.eventtitle32th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2021)en
dc.relation.projectIDGobierno de España. PID2019-106455GB-C21es
dc.relation.projectIDComunidad de Madrid. 49.520608.9.18/ MadridFlightOnChip (MFOC)es
dc.rights© 2021 Elsevier Ltd. All rights reserved.en
dc.rightsThis work is licensed under a Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License.en
dc.rightsAtribución-NoComercial-SinDerivadas 3.0 España*
dc.rights.accessRightsopen accessen
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/3.0/es/*
dc.subject.ecienciaElectrónicaes
dc.subject.otherARMen
dc.subject.otherExceptionsen
dc.subject.otherReliabilityen
dc.subject.otherFault injectionen
dc.subject.otherRadiation effectsen
dc.titleEvaluating reliability through soft error triggered exceptions at ARM Cortex-A9 microprocessoren
dc.typeconference paper*
dc.type.hasVersionAM*
dspace.entity.typePublication
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