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Analysis of neutron sensitivity and data-flow error detection in ARM microprocessors using NEON SIMD extensions

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URI: https://hdl.handle.net/10016/32739
ISSN: 0026-2714
DOI: https://doi.org/10.1016/j.microrel.2019.06.038
UXXI: AR/0000024604
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Neutron_MR_2019_ps.pdf (570.64 KB)
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2019-09
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Elsevier
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Lindoso, A., Garcia-Valderas, M. & Entrena, L. (2019). Analysis of neutron sensitivity and data-flow error detection in ARM microprocessors using NEON SIMD extensions. Microelectronics Reliability, vol. 100-101, 113346.
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