Assessment of New Photosensors for Fast Timing Applications with Large Scintillator Detectors

Thumbnail Image
Publication date
Defense date
Journal Title
Journal ISSN
Volume Title
Ieee - The Institute Of Electrical And Electronics Engineers, Inc
Google Scholar
Research Projects
Organizational Units
Journal Issue
The measurement of absolute nuclear transition probabilities is a very sensitive tool to study the structure of the atomic nucleus. Direct access to transition rates can be achieved via the lifetime of the nuclear levels de-populated in radioactive decay. The Advanced Time-Delayed (ATD) method, or Fast Timing, is a well-established technique to measure lifetimes down to a few ps. The development of the technique was based on the use of BaF_2 detectors, but a recent major breakthrough occurred with the introduction of LaBr_3(Ce) crystals, uniting excellent time response with much superior energy resolution than BaF_2 crystals. Relatively large LaBr_3(Ce) cylindrical detectors of typically 1.5"×1.5" are employed for fast timing, in combination with fast 2-inch photomultiplier tubes from Photonis such as the linear focused 8-stage XP20D0. Another option for a 2-inch fast phototube is the 8-stage Hamamatsu R9779, whose timing properties have already been tested with small LSO crystals. New possibilities are also offered by novel photosensors such as silicon photomultipliers, which are intrinsically fast. In this work we have investigated the performance of the Hamamatsu R9779 photomultiplier tube, and the viability of CeBr_3 crystals for fast-timing applications.
Proceedings of: 2011 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC). Valencia, Spain, 23-29 October 2011
Barium compounds, Bromine compound, Lanthanum compounds, Nuclear energy level transitions, Photodetectors, Photomultipliers, Silicon radiation detectors, Solid scintillation detectors
Bibliographic citation
2011 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC): Valencia, Spain. 23-29 October 2011 (2011). IEEE, 72-74.