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High-Resolution Optical Thickness Measurement Based on Electro-Optic Dual-Optical Frequency Comb Sources

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dc.affiliation.dptoUC3M. Departamento de Tecnología Electrónicaes
dc.affiliation.grupoinvUC3M. Grupo de Investigación: Sensores y Técnicas de Instrumentaciónes
dc.contributor.authorBonilla Manrique, Óscar Elías
dc.contributor.authorMartín Mateos, Pedro
dc.contributor.authorJerez González, Borja
dc.contributor.authorRuiz Llata, Marta
dc.contributor.authorAcedo Gallardo, Pablo
dc.contributor.funderMinisterio de Economía y Competitividad (España)es
dc.date.accessioned2022-11-23T11:42:33Z
dc.date.available2022-11-23T11:42:33Z
dc.date.issued2017-03-01
dc.description.abstractWe propose an optical thickness measurement device based on electro-optic dual-optical frequency combs (dual-OFCs). Optical frequency combs (OFCs) are light sources that provide an optical signal consisting of many equidistant monochromatic tones. In this paper, we present an agile dual-OFC architecture with adjustable frequency separation of the comb modes and total frequency span, allowing high-resolution measurements of the thickness of transparent thick samples. This architecture is based on a single continuous-wave laser diode and external electro-optic devices to implement the dual-comb sensor, allowing easy control of the optical spectrum of the interrogation source (dual-OFC). As it is characteristic of dual-OFC systems, the optical transmittance function of the sample (etalon) is directly translated to the radiofrequency domain, where detection, demodulation, and processing of signals are performed. The shift in the complexity of implementation from the optical to the electronic domain yields many advantages, as acquisition and signal processing are made independently on the optical characteristics of the sample (thickness).en
dc.description.sponsorshipThis work was supported by the Spanish Ministry of Economy and Competitiveness under the RTC-2015-4205-4 Salicar and TEC-2014-52147-R Mossi grants.en
dc.format.extent8
dc.identifier.bibliographicCitationBonilla-Manrique, O. E., Martin-Mateos, P., Jerez, B., Ruiz-Llata, M. & Acedo, P. (2017). High-Resolution Optical Thickness Measurement Based on Electro-Optic Dual-Optical Frequency Comb Sources. IEEE Journal of Selected Topics in Quantum Electronics, 23(2), 140-146.en
dc.identifier.doihttps://doi.org/10.1109/JSTQE.2016.2598607
dc.identifier.issn1077-260X
dc.identifier.publicationfirstpage1
dc.identifier.publicationissue2
dc.identifier.publicationlastpage8
dc.identifier.publicationtitleIEEE Journal of Selected Topics in Quantum Electronicsen
dc.identifier.publicationvolume23
dc.identifier.urihttps://hdl.handle.net/10016/36088
dc.identifier.uxxiAR/0000018361
dc.language.isoeng
dc.publisherIEEEen
dc.relation.projectIDGobierno de España. RTC-2015-4205-4es
dc.relation.projectIDGobierna de España. TEC-2014-52147-Res
dc.rights© 2016 IEEEen
dc.rights.accessRightsopen accessen
dc.subject.ecienciaElectrónicaes
dc.subject.otherDual-optical frequency comb (Dual-OFC)en
dc.subject.otherFabry-Perot etalonen
dc.subject.otherOptical interferometryen
dc.subject.otherThickness measurementen
dc.titleHigh-Resolution Optical Thickness Measurement Based on Electro-Optic Dual-Optical Frequency Comb Sourcesen
dc.typeresearch article*
dc.type.hasVersionAM*
dspace.entity.typePublication
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