Publication:
Multifrequency interferometric imaging with intensity-only measurements

Simple item page
dc.affiliation.dptoUC3M. Departamento de Matemáticases
dc.affiliation.grupoinvUC3M. Grupo de Investigación: Métodos Numéricos y Aplicacioneses
dc.affiliation.institutoUC3M. Instituto Universitario sobre Modelización y Simulación en Fluidodinámica, Nanociencia y Matemática Industrial Gregorio Millán Barbanyes
dc.contributor.authorMoscoso, Miguel
dc.contributor.authorNovikov, Alexei
dc.contributor.authorPapanicolaou, George
dc.contributor.authorTsogka, Chrysoula
dc.contributor.funderMinisterio de Economía y Competitividad (España)es
dc.date.accessioned2021-04-13T08:19:01Z
dc.date.available2021-04-13T08:19:01Z
dc.date.issued2017-07-26
dc.description.abstractWe propose an illumination strategy for interferometric imaging that allows for robust depth recovery from intensity-only measurements. For an array with colocated sources and receivers, we show that all the possible interferometric data for multiple sources, receivers, and frequencies can be recovered from intensity-only measurements provided that we have sufficient source location and frequency illumination diversity. There is no need for phase reconstruction in this approach. Using interferometric imaging methods we show that in homogeneous media there is no loss of resolution when imaging with intensities only. If in these imaging methods we reduce incoherence by restricting the multifrequency interferometric data to nearby array elements and nearby frequencies we obtain robust images in weakly inhomogeneous background media with a somewhat reduced resolution.en
dc.description.sponsorshipThe work of the authors was partially supported by AFOSR FA9550-14-1-0275. The work of the first author was supported by the Spanish MICINN grants FIS2013-41802-R and FIS2016-77892-R. The work of the second author was partially supported by NSF DMS-1515187.en
dc.format.extent28
dc.identifier.bibliographicCitationMoscoso, M., Novikov, A., Papanicolaou, G. & Tsogka, C. (2017). Multifrequency Interferometric Imaging with Intensity-Only Measurements. SIAM Journal on Imaging Sciences, 10(3), pp. 1005–1032.en
dc.identifier.doihttps://doi.org/10.1137/16M1105955
dc.identifier.issn1936-4954
dc.identifier.publicationfirstpage1005
dc.identifier.publicationissue3
dc.identifier.publicationlastpage1032
dc.identifier.publicationtitleSIAM Journal on Imaging Sciencesen
dc.identifier.publicationvolume10
dc.identifier.urihttps://hdl.handle.net/10016/32338
dc.identifier.uxxiAR/0000020554
dc.language.isoeng
dc.publisherSociety for Industrial and Applied Mathematics (SIAM)en
dc.relation.projectIDGobierno de España. FIS2013-41802-Res
dc.relation.projectIDGobierno de España. FIS2016-77892-Res
dc.rights© 2017, Society for Industrial and Applied Mathematicsen
dc.rights.accessRightsopen accessen
dc.subject.ecienciaMatemáticases
dc.subject.otherArray imagingen
dc.subject.otherPhase retrievalen
dc.titleMultifrequency interferometric imaging with intensity-only measurementsen
dc.typeresearch article*
dc.type.hasVersionVoR*
dspace.entity.typePublication
Files
Original bundle
Now showing 1 - 1 of 1
Thumbnail Image
Name:
Multifrequency_JIS_2017.pdf
Size:
2.15 MB
Format:
Adobe Portable Document Format
Download
Collections
DM - TCBIG - Artículos de Revistas