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Positron annihilation study of defect distribution in 8YSZ nanostructure

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dc.affiliation.dptoUC3M. Departamento de Físicaes
dc.affiliation.grupoinvUC3M. Grupo de Investigación: Materiales Nano-Estructurados y Multifuncionaleses
dc.contributor.authorGonzalo-Juan, Isabel
dc.contributor.authorParente, Paola
dc.contributor.authorSánchez-Herencia, A. J.
dc.contributor.authorRubio, Fausto
dc.contributor.authorPareja Pareja, Ramiro
dc.contributor.authorFerrari, Begoña
dc.date.accessioned2014-12-15T11:41:47Z
dc.date.available2014-12-15T11:41:47Z
dc.date.issued2011-05
dc.description.abstractThe impact of the interfacial contribution on overall properties increases with decreasing grain size of polycrystalline materials. It is well known that distribution and size of cluster defects are rather different in bulk than grain boundaries. In light of "bottom-up" approaches, a study at the atomic level determining the distribution of crystallographic defects could clarify their contribution to the macroscopic properties, and then differentiate materials for outstanding or precise applications. In this work, Positron Annihilation Spectroscopy (PAS) is used to characterize the distribution of defects within 8 mol% Y₂O₃-stabilized zirconia (8YSZ) structures prepared by sintering through three different thermal treatments, i.e. a conventional thermal cycle in air and N₂/H₂ atmosphere, and a fast firing cycle in air, which lead to average grain sizes < 260 nm.en
dc.description.sponsorshipThe authors would like to acknowledge the financial support from the Spanish Government through the projects MAT2009-14448-C02-01 and IPT-310000-2010-12.en
dc.description.statusPublicado
dc.format.extent8
dc.format.mimetypeapplication/pdf
dc.identifier.bibliographicCitationSolid State Ionics 190 (2011), pp. 67–74en
dc.identifier.doi10.1016/j.ssi.2011.03.007
dc.identifier.issn0167-2738
dc.identifier.publicationfirstpage67
dc.identifier.publicationissue1
dc.identifier.publicationlastpage74
dc.identifier.publicationtitleSolid State Ionicsen
dc.identifier.publicationvolume190
dc.identifier.urihttps://hdl.handle.net/10016/19786
dc.identifier.uxxiAR/0000009207
dc.language.isoeng
dc.publisherElsevieres
dc.relation.projectIDGobierno de España. MAT 2009-14448-C02-01
dc.relation.projectIDGobierno de España. IPT-310000-2010-12
dc.relation.publisherversionhttp://dx.doi.org/10.1016/j.ssi.2011.03.007
dc.rights© 2011 Elsevier B.V.en
dc.rights.accessRightsopen access
dc.subject.ecienciaFísicaes
dc.subject.ecienciaMaterialeses
dc.subject.otherZirconiaen
dc.subject.otherDefect characterizationen
dc.subject.otherPositron Annihilation Spectroscopyen
dc.titlePositron annihilation study of defect distribution in 8YSZ nanostructureen
dc.typeresearch article*
dc.type.hasVersionAM*
dspace.entity.typePublication
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