Peña Fernández, ManuelLindoso Muñoz, AlmudenaEntrena Arrontes, Luis AlfonsoLopes, Israel C.Pouget, Vincent2022-06-172022-06-172021-08Peña-Fernández, M., et al. Microprocessor error diagnosis by trace monitoring under laser testing. In:IEEE transactions on nuclear science, 68(8), Aug. 2021, Pp. 1651-16590018-94991558-1578 (online)http://hdl.handle.net/10016/35163This work explores the diagnosis capabilities of the enriched information provided by microprocessors trace subsystem combined with laser fault injection. Laser fault injection campaigns with delimited architectural regions have been accomplished on an ARM Cortex-A9 device. Experimental results demonstrate the capability of the presented technique to provide additional information of the various error mechanisms that can happen in a microprocessor. A comparison with radiation campaigns presented in previous work is also discussed, showing that laser fault injection results are in good agreement with neutron and proton radiation results.9eng© 2021 IEEE.ARMError diagnosisFault toleranceLaser fault injectionMicroprocessor traceresearch articleElectrónicaIngeniería Mecánica10.1109/TNS.2021.3067554open access165181659IEEE TRANSACTIONS ON NUCLEAR SCIENCE68AR/0000028793