High-Resolution Optical Thickness Measurement Based on Electro-Optic Dual-Optical Frequency Comb Sources

Abstract

We propose an optical thickness measurement device based on electro-optic dual-optical frequency combs (dual-OFCs). Optical frequency combs (OFCs) are light sources that provide an optical signal consisting of many equidistant monochromatic tones. In this paper, we present an agile dual-OFC architecture with adjustable frequency separation of the comb modes and total frequency span, allowing high-resolution measurements of the thickness of transparent thick samples. This architecture is based on a single continuous-wave laser diode and external electro-optic devices to implement the dual-comb sensor, allowing easy control of the optical spectrum of the interrogation source (dual-OFC). As it is characteristic of dual-OFC systems, the optical transmittance function of the sample (etalon) is directly translated to the radiofrequency domain, where detection, demodulation, and processing of signals are performed. The shift in the complexity of implementation from the optical to the electronic domain yields many advantages, as acquisition and signal processing are made independently on the optical characteristics of the sample (thickness).