Citation:
Abdalmalak, K. A., Botello, G. S., Suresh, M. I., Falcón-Gómez, E., Lavado, A. R., & García-Muñoz, L. E. (2022). An Integrated Millimeter-Wave Satellite Radiometer Working at Room-Temperature with High Photon Conversion Efficiency. In Sensors, 22(6), 2400-2413
xmlui.dri2xhtml.METS-1.0.item-contributor-funder:
Comunidad de Madrid Ministerio de Ciencia e Innovación (España)
Sponsor:
This research was funded by Fundación SENER (REFTA), Comunidad de Madrid
MARTINLARA-CM (P2018/NMT-4333), Agencia Estatal de Investigacion (PID2019-109984RBC41),
and RTC2017-6394-7 projects.
Project:
Gobierno de España. PID2019-109984RB-C41 Gobierno de España. RTC2017-6394-7 Comunidad de Madrid. P2018/NMT-4333
In this work, the design of an integrated 183 GHz radiometer frontend for earth observation
applications on satellites is presented. By means of the efficient electro-optic modulation of a
laser pump with the observed millimeter-wave signal followed by the dIn this work, the design of an integrated 183 GHz radiometer frontend for earth observation
applications on satellites is presented. By means of the efficient electro-optic modulation of a
laser pump with the observed millimeter-wave signal followed by the detection of the generated
optical sideband, a room-temperature low-noise receiver frontend alternative to conventional Low
Noise Amplifiers (LNAs) or Schottky mixers is proposed. Efficient millimeter-wave to 1550 nm
upconversion is realized via a nonlinear optical process in a triply resonant high-Q Lithium Niobate
(LN) Whispering Gallery Mode (WGM) resonator. By engineering a micromachined millimeter-wave
cavity that maximizes the overlap with the optical modes while guaranteeing phase matching, the
system has a predicted normalized photon-conversion efficiency = 10-1 per mW pump power,
surpassing the state-of-the-art by around three orders of magnitude at millimeter-wave frequencies.
A piezo-driven millimeter-wave tuning mechanism is designed to compensate for the fabrication and
assembly tolerances and reduces the complexity of the manufacturing process.[+][-]