Microprocessor error diagnosis by trace monitoring under laser testing

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dc.contributor.author Peña Fernández, Manuel
dc.contributor.author Lindoso Muñoz, Almudena
dc.contributor.author Entrena Arrontes, Luis Alfonso
dc.contributor.author Lopes, Israel C.
dc.contributor.author Pouget, Vincent
dc.date.accessioned 2022-06-17T11:35:17Z
dc.date.available 2022-06-17T11:35:17Z
dc.date.issued 2021-08
dc.identifier.bibliographicCitation Peña-Fernández, M., et al. Microprocessor error diagnosis by trace monitoring under laser testing. In:IEEE transactions on nuclear science, 68(8), Aug. 2021, Pp. 1651-1659
dc.identifier.issn 0018-9499
dc.identifier.issn 1558-1578 (online)
dc.identifier.uri http://hdl.handle.net/10016/35163
dc.description.abstract This work explores the diagnosis capabilities of the enriched information provided by microprocessors trace subsystem combined with laser fault injection. Laser fault injection campaigns with delimited architectural regions have been accomplished on an ARM Cortex-A9 device. Experimental results demonstrate the capability of the presented technique to provide additional information of the various error mechanisms that can happen in a microprocessor. A comparison with radiation campaigns presented in previous work is also discussed, showing that laser fault injection results are in good agreement with neutron and proton radiation results.
dc.format.extent 9
dc.language.iso eng
dc.publisher IEEE
dc.rights © 2021 IEEE.
dc.subject.other ARM
dc.subject.other Error diagnosis
dc.subject.other Fault tolerance
dc.subject.other Laser fault injection
dc.subject.other Microprocessor trace
dc.title Microprocessor error diagnosis by trace monitoring under laser testing
dc.type article
dc.subject.eciencia Electrónica
dc.subject.eciencia Ingeniería Mecánica
dc.identifier.doi 10.1109/TNS.2021.3067554
dc.rights.accessRights openAccess
dc.relation.projectID Comunidad de Madrid. IND2017/TIC-7776
dc.relation.projectID Gobierno de España. PID2019-106455GB-C21
dc.type.version acceptedVersion
dc.identifier.publicationfirstpage 1651
dc.identifier.publicationissue 8
dc.identifier.publicationlastpage 1659
dc.identifier.publicationtitle IEEE TRANSACTIONS ON NUCLEAR SCIENCE
dc.identifier.publicationvolume 68
dc.identifier.uxxi AR/0000028793
dc.contributor.funder Comunidad de Madrid
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