Analysis of neutron sensitivity and data-flow error detection in ARM microprocessors using NEON SIMD extensions

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Analysis of neutron sensitivity and data-flow error detection in ARM microprocessors using NEON SIMD extensions

Author(s): Lindoso Muñoz, Almudena; García Valderas, Mario; Entrena Arrontes, Luis Alfonso
Publisher: Elsevier
Issued date: 2019-09
Citation: Lindoso, A., Garcia-Valderas, M. & Entrena, L. (2019). Analysis of neutron sensitivity and data-flow error detection in ARM microprocessors using NEON SIMD extensions. Microelectronics Reliability, vol. 100-101, 113346.
ISSN: 0026-2714
DOI: https://doi.org/10.1016/j.microrel.2019.06.038
xmlui.dri2xhtml.METS-1.0.item-contributor-funder: Ministerio de Economía y Competitividad (España)
Project: Gobierno de España. ESP2015-68245-C4-1-P
URI: http://hdl.handle.net/10016/32739
Rights: © 2019 Elsevier Ltd.
Atribución-NoComercial-SinDerivadas 3.0 España
© 2019 Elsevier Ltd.

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