Error Detection and Mitigation of Data-Intensive Microprocessor Applications Using SIMD and Trace Monitoring

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dc.contributor.author Peña Fernandez, Manuel
dc.contributor.author Lindoso Muñoz, Almudena
dc.contributor.author Entrena Arrontes, Luis Alfonso
dc.contributor.author García Valderas, Mario
dc.date.accessioned 2021-05-20T10:15:33Z
dc.date.available 2021-05-20T10:15:33Z
dc.date.issued 2020-07
dc.identifier.bibliographicCitation Pena-Fernandez, M., Lindoso, A., Entrena, L. & Garcia-Valderas, M. (2020). Error Detection and Mitigation of Data-Intensive Microprocessor Applications Using SIMD and Trace Monitoring. IEEE Transactions on Nuclear Science, 67(7), pp. 1452–1460.
dc.identifier.issn 0018-9499
dc.identifier.uri http://hdl.handle.net/10016/32701
dc.description.abstract This article proposes a software error mitigation approach that uses the single instruction multiple data (SIMD) coprocessor to accelerate computation over redundant data. In addition, an external IP connected to the microprocessor's trace interface is used to detect errors that are difficult to cover with software-implemented techniques. The proposed approach has been implemented in an ARM microprocessor, and an irradiation campaign with neutrons has been carried out at Los Alamos National Laboratory. Experimental results demonstrate the high error coverage (more than 99.9%) of the proposed approach. The neutron cross section of errors that were not corrected nor detected was reduced by more than three orders of magnitude.
dc.format.extent 9
dc.language.iso eng
dc.publisher IEEE
dc.rights © 2020, IEEE
dc.subject.other ARM
dc.subject.other Error detection
dc.subject.other Error mitigation
dc.subject.other Microprocessor
dc.subject.other Microprocessor trace
dc.subject.other Neon
dc.subject.other Single instruction multiple data (SIMD)
dc.title Error Detection and Mitigation of Data-Intensive Microprocessor Applications Using SIMD and Trace Monitoring
dc.type article
dc.subject.eciencia Electrónica
dc.identifier.doi https://doi.org/10.1109/TNS.2020.2992299
dc.rights.accessRights openAccess
dc.relation.projectID Gobierno de España. ESP2015-68245-C4-1-P
dc.relation.projectID Comunidad de Madrid. IND2017/TIC-7776
dc.type.version acceptedVersion
dc.identifier.publicationfirstpage 1452
dc.identifier.publicationissue 7
dc.identifier.publicationlastpage 1460
dc.identifier.publicationtitle IEEE Transactions on Nuclear Science
dc.identifier.publicationvolume 67
dc.identifier.uxxi AR/0000026785
dc.contributor.funder Ministerio de Economía y Competitividad (España)
dc.contributor.funder Comunidad de Madrid
dc.affiliation.dpto UC3M. Departamento de Tecnología Electrónica
dc.affiliation.grupoinv UC3M. Grupo de Investigación: Diseño Microelectrónico y Aplicaciones (DMA)
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