The Use of Microprocessor Trace Infrastructures for Radiation-Induced Fault Diagnosis

Peña Fernandez, Manuel; Lindoso Muñoz, Almudena; Entrena Arrontes, Luis Alfonso; García Valderas, Mario

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The Use of Microprocessor Trace Infrastructures for Radiation-Induced Fault Diagnosis

Author(s): Peña Fernandez, Manuel; Lindoso Muñoz, Almudena; Entrena Arrontes, Luis Alfonso; García Valderas, Mario

Publisher: IEEE

Issued date: 2020-01

Citation: Pena-Fernandez, M., Lindoso, A., Entrena, L. & Garcia-Valderas, M. (2020). The Use of Microprocessor Trace Infrastructures for Radiation-Induced Fault Diagnosis. IEEE Transactions on Nuclear Science, 67(1), pp. 126–134.

ISSN: 0018-9499

DOI: https://doi.org/10.1109/TNS.2019.2956204

xmlui.dri2xhtml.METS-1.0.item-contributor-funder: Ministerio de Economía y Competitividad (España)
Comunidad de Madrid

Project: Gobierno de España. ESP2015-68245-C4-1-P
Comunidad de Madrid. IND2017/TIC-7776

Keywords: ARM , Fault diagnosis , Fault tolerance , Microprocessor trace , Single-event effects

URI: http://hdl.handle.net/10016/32699

Abstract:

This work proposes a methodology to diagnoseradiation-induced faults in a microprocessor using the hardwaretrace infrastructure. The diagnosis capabilities of this approachare demonstrated for an ARM microprocessor under neutronand proton irradiation campaigns [+]

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