On the Entropy of Oscillator-Based True Random Number Generators under Ionizing Radiation

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dc.contributor.author Martín González, Honorio
dc.contributor.author Entrena Arrontes, Luis Alfonso
dc.contributor.author Martin Holgado, Pedro
dc.contributor.author Morilla, Yolanda
dc.contributor.author Peris López, Pedro
dc.date.accessioned 2019-02-11T09:33:52Z
dc.date.available 2019-02-11T09:33:52Z
dc.date.issued 2018-07-09
dc.identifier.bibliographicCitation Martin, H., Martin-Holgado, P., Peris-Lopez, P., Morilla, Y., Entrena, L. (2018). On the Entropy of Oscillator-Based True Random Number Generators under Ionizing Radiation. Entropy, 20 (7), 513.
dc.identifier.issn 1099-4300
dc.identifier.uri http://hdl.handle.net/10016/28038
dc.description.abstract The effects of ionizing radiation on field-programmable gate arrays (FPGAs) have been investigated in depth during the last decades. The impact of these effects is typically evaluated on implementations which have a deterministic behavior. In this article, two well-known true-random number generators (TRNGs) based on sampling jittery signals have been exposed to a Co-60 radiation source as in the standard tests for space conditions. The effects of the accumulated dose on these TRNGs, an in particular, its repercussion over their randomness quality (e.g., entropy or linear complexity), have been evaluated by using two National Institute of Standards and Technology (NIST) statistical test suites. The obtained results clearly show how the degradation of the statistical properties of these TRNGs increases with the accumulated dose. It is also notable that the deterioration of the TRNG (non-deterministic component) appears before that the degradation of the deterministic elements in the FPGA, which compromises the integrated circuit lifetime.
dc.description.sponsorship This work was partially supported by the Spanish Ministry of Economy and Competitiveness under contracts ESP-2015-68245-C4-1-P and ESP-2015-68245-C4-4-P; by the MINECO grant TIN2016-79095-C2-2-R (SMOG-DEV - Security mechanisms for fog computing: advanced security for devices); and by the CAM grant S2013/ICE-3095 (CIBER- DINE: Cybersecurity, Data, and Risks).
dc.format.extent 13
dc.format.mimetype application/pdf
dc.language.iso eng
dc.publisher MDPI
dc.rights © 2018 by the authors; licensee MDPI, Basel, Switzerland.
dc.rights Atribución-NoComercial-SinDerivadas 3.0 España
dc.rights.uri http://creativecommons.org/licenses/by-nc-nd/3.0/es/
dc.subject.other TRNG entropy
dc.subject.other Ionizing radiation
dc.subject.other Ring oscillator
dc.subject.other Self-timed ring
dc.subject.other NIST
dc.title On the Entropy of Oscillator-Based True Random Number Generators under Ionizing Radiation
dc.type article
dc.subject.eciencia Electrónica
dc.identifier.doi https://www.doi.org/10.3390/e20070513
dc.rights.accessRights openAccess
dc.relation.projectID Gobierno de España. ESP-2015-68245-C4-1-P
dc.relation.projectID Gobierno de España. ESP-2015-68245-C4-4-P
dc.relation.projectID Gobierno de España. TIN2016-79095-C2-2-R
dc.relation.projectID Comunidad de Madrid. S2013/ICE-3095/CIBERDINE
dc.type.version publishedVersion
dc.identifier.publicationtitle Entropy
dc.identifier.publicationvolume 20
dc.identifier.uxxi AR/0000021898
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