Martinez-Alvarez, A., Restrepo-Calle, F., Cuenca-Asensi, S., Reyneri, L. M., Lindoso, A. & Entrena, L. (2016). A Hardware-Software Approach for On-Line Soft Error Mitigation in Interrupt-Driven Applications. IEEE Transactions on Dependable and Secure Computing, 13(4), 502–508.
Lindoso, A., Entrena, L., Garcia-Valderas, M. & Parra, L. (2017). A Hybrid Fault-Tolerant LEON3 Soft Core Processor Implemented in Low-End SRAM FPGA. IEEE Transactions on Nuclear Science, 64(1), pp. 374–381.
Pérez Sanjurjo, J., Prefasi, E., Buffa, C., Gaggl, R. (2017). A Capacitance-To-Digital Converter for MEMS Sensors for Smart Applications. Sensors, 17 (6), 1312.
Fernandez-Alvarez, A., Portela-Garcia, M., Garcia-Valderas, M., Lopez, J. & Sanz, M. (2017). HW/SW Co-Simulation System for Enhancing Hardware-in-the-Loop of Power Converter Digital Controllers. IEEE Journal of Emerging and Selected Topics in Power Electronics, 5(4), pp. 1779–1786.
Martin, H., Di Natale, G. & Entrena, L. (2018). Towards a Dependable True Random Number Generator With Self-Repair Capabilities. IEEE Transactions on Circuits and Systems I: Regular Papers, 65(1), pp. 247–256.
Cardes, F., Quintero, A., Gutiérrez, E., Buffa, C., Wiesbauer, A., Hernández, L. (2018). SNDR Limits of Oscillator-Based Sensor Readout Circuits. Sensors, 18 (2), 445.
Martin, H., Martin-Holgado, P., Peris-Lopez, P., Morilla, Y., Entrena, L. (2018). On the Entropy of Oscillator-Based True Random Number Generators under Ionizing Radiation. Entropy, 20 (7), 513.
Lindoso, A., Garcia-Valderas, M., Entrena, L., Morilla, Y. & Martin-Holgado, P. (2018). Evaluation of the Suitability of NEON SIMD Microprocessor Extensions Under Proton Irradiation. IEEE Transactions on Nuclear Science, 65(8), pp. 1835–1842.
Martin, H., Martin-Holgado, P., Morilla, Y., Entrena, L., San-Millán, E. (2018). Total Ionizing Dose Effects on a Delay-Based Physical Unclonable Function Implemented in FPGAs. Electronics, 7 (9), 163.
Peña-Fernandez, M., Lindoso, A., Entrena, L., Garcia-Valderas, M., Philippe, S., Morilla, Y. & Martin-Holgado, P. (2018). PTM-based hybrid error-detection architecture for ARM microprocessors. Microelectronics Reliability, vol. 88-90, pp. 925–930.
Pena-Fernandez, M., Lindoso, A., Entrena, L., Garcia-Valderas, M., Morilla, Y. & Martin-Holgado, P. (2019). Online Error Detection Through Trace Infrastructure in ARM Microprocessors. IEEE Transactions on Nuclear Science, 66(7), pp. 1457–1464.
Lindoso, A., Garcia-Valderas, M. & Entrena, L. (2019). Analysis of neutron sensitivity and data-flow error detection in ARM microprocessors using NEON SIMD extensions. Microelectronics Reliability, vol. 100-101, 113346.
Peña-Fernández, M., Serrano-Cases, A., Lindoso, A., García-Valderas, M., Entrena, L., Martínez-Álvarez, A. & Cuenca-Asensi, S. (2019). Dual-Core Lockstep enhanced with redundant multithread support and control-flow error detection. Microelectronics Reliability, vol. 100-101, 113447.