Cita:
2008 IEEE Nuclear Science Symposium Conference Record, October 2008, p. 5007 - 5009
ISBN:
978-1-4244-2714-7
ISSN:
1082-3654
DOI:
10.1109/NSSMIC.2008.4774364
Patrocinador:
This work is partially funded by the CD-TEAM Project, CENIT Program, Spanish Ministerio de Industria, and with grants from the Ministerio de Educaci6n y Ciencia, projects TEC200764731 and TEC2008-06715-C02-01.
X-ray CT images usually show artefacts due not only to physical effects -e.g., beam hardening-, but also to misalignments that remain after mechanical calibration. These
artefacts become particularly noticeable in the case of high spatial resolution systems aX-ray CT images usually show artefacts due not only to physical effects -e.g., beam hardening-, but also to misalignments that remain after mechanical calibration. These
artefacts become particularly noticeable in the case of high spatial resolution systems and in hybrid systems, such as PETCT,
SPECT-CT scanners, which rely on a correct registration of emission and CT data. Hence, slight mechanical misalignments affect the quality of the CT images and any attenuation
correction methods or further quantification based on them. We implemented a computer simulator of these artefacts on a conebeam,
flat-panel based micro-CT scanner. Using this simulator, we studied the effect of these different misalignments (pitch and
roll tilts, skew and shifts) on reconstructed images.[+][-]
Nota:
Proceeding of: 2008 IEEE Nuclear Science Symposium Conference Record (NSS '08), Dresden, Germany, 19-25 October 2008
