Publication:
The Use of Microprocessor Trace Infrastructures for Radiation-Induced Fault Diagnosis

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2020-01
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IEEE
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Abstract
This work proposes a methodology to diagnoseradiation-induced faults in a microprocessor using the hardwaretrace infrastructure. The diagnosis capabilities of this approachare demonstrated for an ARM microprocessor under neutronand proton irradiation campaigns. The experimental resultsdemonstrate that the execution status in the precise moment thatthe error occurred can be reconstructed, so that error diagnosiscan be achieved.
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ARM, Fault diagnosis, Fault tolerance, Microprocessor trace, Single-event effects
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Pena-Fernandez, M., Lindoso, A., Entrena, L. & Garcia-Valderas, M. (2020). The Use of Microprocessor Trace Infrastructures for Radiation-Induced Fault Diagnosis. IEEE Transactions on Nuclear Science, 67(1), pp. 126–134.