Español English Contacte con nosotros http://www.uc3m.es/portal/page/portal/biblioteca
DSpace e-Archivo

Archivo Abierto Institucional de la Universidad Carlos III de Madrid > Investigación > Departamentos > Departamento de Economía > DE - Working Papers. Economics. WE >

Please use this identifier to cite or link to this item: http://hdl.handle.net/10016/880

Google™ Scholar. Others By: Dolado, Juan José - Gonzalo, Jesús - Mayoral, Laura
Files in This Item:
efdfdtjune25.pdf-- 2007-07-17 -- Available on Internet -- preprint339,23 kBAdobe PDFformato pdf
Title: Wald Tests of I(1) against I(d) alternatives : some new properties and an extension to processes with trending components
Author(s): Dolado, Juan José [dolado]
Gonzalo, Jesús [jgonzalo]
Mayoral, Laura
Publisher: Universidad Carlos III de Madrid. Departamento de Economía
Issued date: 25-Jun-2007
URI: http://hdl.handle.net/10016/880
Abstract: This paper analyses the power properties, under fixed alternatives, of a Wald-type test, i.e., the (Efficient) Fractional Dickey-Fuller (EFDF) test of I(1) against I(d), d<1, relative to LM tests. Further, it extends the implementation of the EFDF test to the presence of deterministic trending components in the DGP. Tests of these hypotheses are important in many macroeconomic applications where it is crucial to distinguish between permanent and transitory shocks because shocks die out in I(d) processes with d<1. We show how simple is the implementation of the EFDF in these situations and argue that, under fixed alternatives, it has better power properties than LM tests. Finally, an empirical application is provided where the EFDF approach allowing for deterministic components is used to test for long-memory in the GDP p.c. of several OECD countries, an issue that has important consequences to discriminate between alternative growth theories.
Keywords: Deterministic components
Fractional processes
Power
Unit roots
JEL Classification: C12
C22
O40
Appears in Collections:DE - Working Papers. Economics. WE
Economists Online

Refworks Export

SFX Query

This item is licensed under a Creative Commons License
Creative Commons

Items in E-Archivo are protected by copyright, with all rights reserved, unless otherwise indicated.

 

Valid XHTML 1.0! © Universidad Carlos III de Madrid - Software DSpace - Terms of use - Feedback