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|Title: ||Statistical pattern modeling in vision-based quality control systems|
|Author(s): ||Armingol, José M.|
Escalera, Arturo de la
Pastor, José M.
Rodríguez, Francisco J.
|Publisher: ||Kluwer Academic Publishers|
|Issued date: ||2003|
|Citation: ||Journal of Intelligent and Robotics Systems, 2003, vol. 37, n. 3, p. 321-336|
|ISSN: ||0921-0296 (Print)|
|Abstract: ||Machine vision technology improves productivity and quality management and provides a competitive advantage to industries that employ this technology. In this article, visual inspection and quality control theory are combined to develop a robust inspection system with manufacturing applications. The inspection process might be defined as the one used to determine if a given product fulfills a priori specifications, which are the quality standard. In the case of visual inspection, these specifications include the absence of defects, such as lack (or excess) of material, homogeneous visual aspect, required color, predetermined texture, etc. The characterization of the visual aspect of metallic surfaces is studied using quality control chars, which are a graphical technique used to compare on-line capabilities of a product with respect to these specifications. Original algorithms are proposed for implementation in automated visual inspection applications with on-line execution requirements. The proposed artificial vision method is a hybrid between the two usual methods of pattern comparison and theoretical decision. It incorporates quality control theory to statistically model the pattern for defect-free products. Specifically, individual control charts with 6-sigma limits are set so the inspection error is minimized. Experimental studies with metallic surfaces help demonstrate the efficacy and robustness of the proposed methodology.|
|Publisher version: ||http://dx.doi.org/10.1023/A:1025489610281|
|Keywords: ||Quality control charts|
Automated visual inspection
Statistical pattern recognition
|Rights: ||© Kluwer Academic Publishers|
|Appears in Collections:||DISA - LSI - Artículos de Revistas|
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