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Please use this identifier to cite or link to this item: http://hdl.handle.net/10016/2492

Google™ Scholar. Others By: Delgado, Miguel A. - Velasco, Carlos
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Sign_tests_JE_2005_.ps.pdf-- 2009-06-24 -- Available on Internet -- postprint672,97 kBAdobe PDFformato pdf
Title: Sign Tests for Long-memory Time Series
Author(s): Delgado, Miguel A. [delgado]
Velasco, Carlos [cavelas]
Publisher: Elsevier
Issued date: 2005
Citation: Journal of Econometrics, 2005, vol. 128, nº 2, p. 215-251
URI: http://hdl.handle.net/10016/2492
ISSN: 0304-4076
DOI: 10.1016/j.jeconom.2004.08.013
Abstract: This paper proposes sign-based tests for simple and composite hypotheses on the long-memory parameter of a time series process. The tests allow for nonstationary hypothesis, such as unit root, as well as for stationary hypotheses, such as weak dependence or no integration. The proposed generalized Lagrange multiplier sign tests for simple hypotheses on the long-memory parameter are exact and locally optimal among those in their class. We also propose tests for composite hypotheses on the parameters of ARFIMA processes. The resulting tests statistics have a standard normal limiting distribution under the null hypothesis.
Review: PeerReviewed
Publisher version: http://dx.doi.org/10.1016/j.jeconom.2004.08.013
Keywords: Exact tests
Nonparametric tests
Infinite variance
Long-range dependence
Fractional processes
Nonstationarity
Optimal test
JEL Classification: C12
C22
Rights: © Elsevier
Appears in Collections:DE - Artículos de Revistas
Economists Online

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