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Please use this identifier to cite or link to this item: http://hdl.handle.net/10016/14331

Google™ Scholar. Others By: Sguera, Carlo - Galeano, Pedro - Lillo, Rosa E.
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Title: Spatial depth-based classification for functional data
Author(s): Sguera, Carlo
Galeano, Pedro
Lillo, Rosa E.
Publisher: Universidad Carlos III de Madrid. Departamento de Estadística
Issued date: May-2012
URI: http://hdl.handle.net/10016/14331
Abstract: Functional data are becoming increasingly available and tractable because of the last technological advances. We enlarge the number of functional depths by defining two new depth functions for curves. Both depths are based on a spatial approach: the functional spatial depth (FSD), that shows an interesting connection with the functional extension of the notion of spatial quantiles, and the kernelized functional spatial depth (KFSD), which is useful for studying functional samples that require an analysis at a local level. Afterwards, we consider supervised functional classification problems, and in particular we focus on cases in which the samples may contain outlying curves. For these situations, some robust methods based on the use of functional depths are available. By means of a simulation study, we show how FSD and KFSD perform as depth functions for these depth-based methods. The results indicate that a spatial depthbased classification approach may result helpful when the datasets are contaminated, and that in general it is stable and satisfactory if compared with a benchmark procedure such as the functional k-nearest neighbor classifier. Finally, we also illustrate our approach with a real dataset.
Sponsor: This research was partially supported by Spanish Ministry of Education and Science grant 2007/04438/001, by Madrid Region grant 2011/00068/001, by Spanish Ministry of Science and Innovation grant 2012/00084/001 and by MCI grant MTM2008-03010.
Serie / Nº.: UC3M Working papers. Statistics and Econometrics
12-06
Keywords: Depth notion
Spatial functional depth
Supervised functional classification
Depth-based method
Outliers
Appears in Collections:DES - Working Papers. Statistics and Econometrics. WS

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