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Archivo Abierto Institucional de la Universidad Carlos III de Madrid >
Browsing by Subject [PACS] Atomic force microscopy (AFM)
Showing results 1 to 2 of 2
| Issue Date | Title | Author(s) | Type | | 15-Mar-2009 | Anisotropic scaling of ripple morphologies on high-fluence sputtered silicon | Keller, Adrian; Cuerno, Rodolfo; Facsko, Stefan; Möller, Wolfhard | article |
| Jun-2002 | Nanopatterning of silicon surfaces by low-energy ion-beam sputtering: dependence on the angle of ion incidence | Gago, Raúl; Vázquez, Luis; Cuerno, Rodolfo; Varela, María; Ballesteros, Carmen; Albella, José María | article |
Showing results 1 to 2 of 2
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